News from Basler

On this page you will find up-to-date information about our products, videos, white papers or events and other exciting news about the company.

To the press releasesTrade shows & events

  • Improving ID read accuracy on low-contrast semiconductor materials

    Low-contrast laser marks, reflective surfaces, and tight tolerances make ID reading in semiconductor environments a major challenge. Discover how we deliver accurate, reliable identification of wafer edge OCR, carrier ring codes, and substrate markings to ensure full traceability across every stage of production.

    • Semiconductors
    LogiMAT logo

    LogiMAT 2025: Our Highlights

    At our booth, we used hands-on demonstrations to show how our machine vision solutions can help you make your logistics processes more efficient and cost-effective, from receiving to shipping.

    GigE Vision cameras

    GigE Vision 3.0 with RoCEv2 protocol

    GigE Vision 3.0 takes advantage of the advances in Ethernet hardware and the RoCEv2 protocol. The new version thus improves speed and latency in image processing and industrial automation.

    • Interfaces & Standards
    • Camera technology
    Confidentiality agreement

    Market research at Basler

    Shape the future of machine vision and help us to make our products and services even better. Sign up and become part of our market research initiative!

    Before vs after FFC

    Achieve Perfect Image Uniformity with Shading and Flat Field Correction (FFC)

    Explore our unique, customizable solution beyond standard Flat Field Correction (FFC) and shading correction. Benefit from rapid program development and optimization, without the typical time and cost constraints associated with algorithm development.

    • Electronics
    • AOI, error detection, and quality control

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We will be happy to advise you on product selection and find the right solution for your application.

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