Area scan camera

ace 2 X visSWIR

SWIR cameras see what remains hidden from our eyes

Short-wave infrared cameras enable applications such as: checking security features, detecting fill levels, penetrating complex structures, or detecting hidden objects.

To the ace 2 X visSWIR cameras

visible + SWIR
Images in both the visible and invisible light spectrum, with wavelengths from 0.4 µm to 1.7 µm
High resolution and detail
Thanks to the highly-sensitive Sony IMX990/991 SenSWIR sensors
Compact design
Easily designed in thanks to the compact 29 mm x 29 mm housing
visSWIR accessories
Wide range of visSWIR components suitable for short-wave infrared applications
Standard interfaces
GigE and USB 3.0 interfaces for high data throughput, supported by industrial PCs and embedded systems
Integrated image acquisition
Camera control and image acquisition in one system
Top price/performance ratio
SWIR portfolio maintains high quality and low list prices
High durability and reliability
Our products are known for reliability and durability, supported by a three-year warranty

Pixel Correction Beyond

Pixel Correction Beyond is an improved, dynamic Defect Pixel Correction. This feature corrects possible pixel defects (like hot pixels and defect pixels) in our visSWIR cameras using an algorithm we developed and patented. It performs dynamic corrections on the current images in relation to the image content directly on the camera.

More about Pixel Correction Beyond

Capabilities of the ace 2 X visSWIR cameras

ace 2 X visSWIR cameras operate in the Short-Wave Infrared (SWIR) range. In this spectral range, many materials have different optical properties than in the visible range. This enables applications that are not possible in the visible waveband.

A view below the surface: bruise on an apple at 1000 nm (NIR) compared to 1350 nm (SWIR) — Bruise on an apple at 1000 nm (NIR) compared to 1350 nm (SWIR)

See below the surface

Light in the SWIR spectral range makes many materials transparent. As a result, short-wave infrared (SWIR) cameras allow a view of what lies beneath the surface. For example, defects in fruit and vegetables can be detected, fill levels in otherwise opaque containers can be checked, or electronic devices can be inspected to ensure they are fully loaded.

Temperature detection

SWIR cameras can be used above approximately 140°C for temperature measurement or estimation of objects. Different temperatures produce different levels of brightness in the SWIR spectral range, a property that can be used for process monitoring or to inspect weld seams, for example.

Typical applications in the SWIR spectral range

A large variety of applications exist for vision systems in the SWIR spectral range, extending from semiconductor inspection to recycling to quality inspection to sorting food products.

Wafer inspection

Silicon is transparent in the SWIR spectral range, so defects (such as voids, cracks, and impurities) become visible during the production and inspection of semiconductors.

Solar inspection

SWIR technology allows defects that are normally imperceptible in the visible frequency range to be detected during the inspection of individual silicon blocks or complete photovoltaic cells.

Material sorting

In the SWIR waveband, different materials can be distinguished and sorted based on their optical properties. For example, different plastics can be separated from each other during recycling.

Level control

In the SWIR waveband, fill levels can be detected through materials that are otherwise opaque. This could include plastic bottles in beverage filling or blister packs in the pharmaceutical industry.

Checking security and authenticity

During the production of banknotes and ID documents, security features (such as metal strips) can be checked below the surface for defects or counterfeits. It is also possible to inspect special inks in the infrared spectrum.

Food quality control

To assure the quality of agricultural products, defects are detected below the surface. A distinction can also be made between product and impurities, for example: between a potato and a stone.

Interested in a solution with SWIR technology? Our team of application engineers can test your use case. Contact us, we're happy to help!