Use Case

Reliable Inspection of Contact Lenses in Blister Packs Using SWIR Technology

Contact lenses require flawless quality to ensure user safety and comfort. Basler’s ace 2 X visSWIR cameras deliver precise inspection through transparent blister packaging and saline solution, detecting even the smallest cracks, bubbles, or contamination. With exceptional sensitivity across the visible to SWIR spectrum, they enable reliable, high-throughput inspection that ensures every lens meets the highest medical standards.

Reliable Inspection of Contact Lenses
Under visible light, the transparent lens is nearly invisible against its background. At 1300 nm SWIR illumination, the lens becomes clearly defined, enabling precise detection and inspection.

Inspection challenges: When transparency becomes the obstacle

Contact lens blister inspection is one of the most complex vision tasks in medical device manufacturing, as it involves multiple transparent materials (the contact lens itself, saline water, air bubbles, and a clear plastic blister cover). These elements interact optically, creating unpredictable reflections, scattering, and contrast loss. As a result, conventional visible cameras often struggle to deliver reliable detection.

Under visible light, the transparent lens is nearly invisible against its background. At 1300 nm SWIR illumination, the lens becomes clearly defined, enabling precise detection and inspection.

Low contrast between transparent materials

In visible or near-infrared imaging, water, air, and the polymer lens all appear similar in intensity and texture. The edges of the lens often blend into the background, making it difficult to determine its contour or orientation. Even small shifts in illumination or camera angle can cause the lens outline to disappear completely. This lack of contrast prevents accurate differentiation between materials and leads to unstable inspection results, especially in high-speed production lines.

Water absorbs more strongly in the SWIR spectrum, creating a natural contrast separation that clearly defines the lens against the saline solution. This enhanced material differentiation provides stable, repeatable detection of lens boundaries, even under fast-moving or variable lighting conditions.

contact lens defect
Scratches and surface defects on the contact lens become clearly visible under 1300 nm SWIR illumination, revealing details that remain hidden under standard visible light.

Hidden scratches and fine surface defects

Cosmetic and surface defects such as scratches, cuts, and abrasions can form during molding, handling, or packaging but are often hidden by the saline and curved lens surface. Reflections and low contrast make these flaws difficult to detect with standard visible or NIR cameras, leading to missed defects and inconsistent inspection results.

SWIR imaging overcomes these limitations by penetrating saline more effectively and reducing surface reflections. This allows subtle thickness variations and micro-scratches to appear with higher contrast, enabling more reliable and repeatable defect detection than conventional imaging methods.

Seeing beyond the limits of visible light

Unlike conventional visible or NIR cameras that rely on reflected light in the 400–1000 nm range, SWIR imaging operates across a broader 400–1700 nm spectrum — where light interacts differently with materials such as water and silicone hydrogel. In this region, SWIR wavelengths penetrate translucent and reflective surfaces, revealing subsurface features that standard imaging cannot detect. This unique spectral behavior allows SWIR cameras to exploit the varying absorption properties of water and polymers, creating strong natural contrast even through saline-filled blister packs. As a result, defects like fine scratches, micro-cracks, and air bubbles become distinctly visible without complex lighting setups. With faster signal response and reduced glare from specular surfaces, SWIR imaging delivers sharper, more stable images — enabling precise, real-time defect detection and streamlined inspection in high-throughput contact lens production.

Light spectrum
Basler’s ace 2 X visSWIR cameras capture both visible and SWIR wavelengths (400–1700 nm), revealing defects invisible to standard imaging.
Contact lens AOI is challenging due to low contrast in saline blisters and hidden micro-scratches. We work with customers to test SWIR wavelengths, optics, and illumination, enabling reliable, high-speed inspection and faster integration of the right vision setup.
Basler Field Application Engineer Team Leader

ace 2 X visSWIR camera models

Find the right camera for your application or use our Vision System Configurator to configure your system.

Ready to get started together?

Learn more about our products, services, and how we can help you with your next project.