ace 2 X visSWIR camera
Area scan camera

ace 2 X visSWIR - SWIR cameras

See what remains hidden from our eyes

The ace 2 X visSWIR cameras offer superior image quality in both visible and short-wave infrared spectrums. Compact and cost-effective, they excel in applications like penetrating complex structures or detecting hidden objects, where conventional SWIR cameras are too large or expensive.
  • visible + SWIR

    Image acquisition in the visible and short-wave infrared spectrum up to 1.7 µm
  • Small size, small price

    Camera with a compact housing measuring just 29 mm x 29 mm at a low price
  • High image quality

    This uncooled camera delivers exceptional image quality thanks to innovative firmware features
  • Extensive visSWIR accessories

    Coordinated components for a complete vision system from a single source

The best of both worlds thanks to innovative firmware features

Our ace 2 X visSWIR cameras combine the high image quality of a cooled SWIR camera with the size and price of an uncooled SWIR camera.

SWIR sensors (short wavelength infrared, or SWIR) based on InGaAs technology tend to have pixel defects that become visible as white dots in the image. A longer exposure time or increased sensor temperature intensify this effect. Therefore, cameras with cooling are often used, resulting in a detrimental effect on the size and price of the SWIR cameras.

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Left: uncooled ace 2 X visSWIR camera with Pixel Correction Beyond | Right: uncooled comparison camera

Images without pixel defects thanks to Pixel Correction Beyond

The pixel defects typical of InGaAs sensors can have a negative impact on image processing. Pixel Correction Beyond is a dynamic defect pixel correction that addresses this issue, and one of the reasons for the outstanding image quality of our SWIR cameras.

The feature is based on an algorithm we developed. During use, it recognizes the pixel defects in each image and corrects them directly in the camera's FPGA without distorting the image content.

More about Pixel Correction Beyond

Left: Line Noise Reduction off | Right: Line Noise Reduction on

Homogeneous background thanks to Line Noise Reduction

In order to achieve the same excellent image quality with the SWIR cameras with VGA or 1.3 MP resolution (IMX991 or IMX990) as with the high-resolution SWIR cameras, these models feature Line Noise Reduction.

This feature minimizes background noise, which is visible as horizontal stripes in the image, in real time and thus ensures a more homogeneous background.

Exploring SWIR technology and Basler's unique edge

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Capabilities of the ace 2 X visSWIR cameras

The ace 2 X visSWIR cameras detect light in both the visible and short-wave infrared range (SWIR). In the SWIR range with wavelengths from 0.9 µm to 1.7 µm, many materials have different optical properties. This opens up new application fields.

View below the surface - bruise on an apple at 1000 nm (NIR) compared to 1350 nm (SWIR)
Bruise on an apple at 1000 nm (NIR) compared to 1350 nm (SWIR)

Look below the surface

Due to the longer wavelength, short-wave infrared light penetrates some materials, causing them to appear transparent. This allows SWIR cameras to see what lies beneath the surface. For example, bruises on fruit and vegetables can be detected, fill levels can be checked in otherwise opaque containers, and semiconductors can be inspected for defects.

Temperature detection - soldering iron with a temperature of ~400 °C at 1,000 nm (NIR) compared to 1,350 nm (SWIR).
Soldering iron with a temperature of ~400 °C at 1,000 nm (NIR) compared to 1,350 nm (SWIR).

Temperature detection

Hot surfaces (from approx. 140°C) emit light in the short-wave infrared range, which is why SWIR cameras are used to measure or estimate the temperature of objects. The intensity in the image is directly related to the temperature. This property can then be used to monitor thermal processes, such as the inspection of welding seams.

Typical application fields in the SWIR spectral range 

The variety of applications for vision systems in the SWIR spectral range extends from semiconductor inspection and recycling to quality inspection and sorting of food products.

Wafer inspection

Silicon is transparent in the SWIR spectral range, so defects (such as voids, cracks, and impurities) become visible during the production and inspection of semiconductors.

Solar inspection

SWIR technology allows defects that are normally imperceptible in the visible frequency range to be detected during the inspection of individual silicon blocks or complete photovoltaic cells.

Material sorting

In the SWIR waveband, different materials can be distinguished and sorted based on their optical properties. For example, different plastics can be separated from each other during recycling.

Level control

In the SWIR waveband, fill levels can be detected through materials that are otherwise opaque. This could include plastic bottles in beverage filling or blister packs in the pharmaceutical industry.

Checking security and authenticity

During the production of banknotes and ID documents, security features (such as metal strips) can be checked below the surface for defects or counterfeits. It is also possible to inspect special inks in the infrared spectrum.

Food quality control

In the quality assurance of agricultural products, pressure marks can be detected or the sugar content estimated. The SWIR spectral range can also be used to distinguish more reliably between product and impurities - for example: potatoes versus stones.

Interested in a solution with SWIR technology? Our team of application engineers can test your use case. Contact us, we're happy to help!

Download ace 2 X visSWIR Portfolio Flyer

More products for your complete visSWIR system

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We will be happy to advise you on product selection and find the right solution for your application.