CXP-12 Solution for the Inspection of Electronic Components

Basler's CXP-12 image processing solutions are used in the quality assurance of various electronic components. For imaging defect inspection of CMOS image sensors and brightness inspection of display panels, boost cameras with a large depth of field (telecentric lens) and those with high resolutions including a large field of view, are suitable.

They demonstrate their strength in both applications – the inspection of CMOS sensors for scratches and the smallest defects, as well as the brightness inspection of the panels. Combined with a suitable CXP-12 interface card and other CXP-12 components including our proven pylon Camera Software Suite, they enable a broad variety of applications.