Wafer Inspection on the Edge
Through an ML-based model integrated with a processing board designed in-house at Basler, the system is able to identify and detect anomalies in a semiconductor wafer.
High Resolution and High Speed Portfolios
The trends towards higher resolution and higher speed in computer vision set-ups are well in line with application requirement of smart factories. In addition to existing CXP-12 portfolios, we are launching new portfolios during the show!
Volume Measurement with 3D Vision Solution
Warehouse automation solutions from Basler will support you in processes such as volume measurement, palletizing/depalletizing picking and packing.
Attendees will have chances to network and obtain first-hand information about current trend topics and discuss with our vision experts about how to enhance your automation solutions with advanced vision technology.
We look forward to meeting you at the shows!
Contact our sales team if you have any questions or would like to make an appointment.