During recent weeks, we have developed a system for measuring the electroluminescence in solar cells. This is a first step in presenting the procedure to the photovoltaic industry.

The latest version of Basler's solar inspection system enables you to detect not only microcracks, but also other types of defects, for example foreign-body inclusions. A finely optimized Classifier allows you to classify any suspect areas in accordance with various mathematical criteria to distinguish between different types of defects such as microcracks or foreign-body inclusions. The system is therefore able to sort the defective wafers according to the type of defects.

Following the presentation of our microcrack inspection system at last year’s European Photovoltaic Conference and Exhibition in Dresden, our electroluminescence laboratory workplace will be on show together with solutions for thin-film photovoltaic at this year's exhibition in Milan.

Basler has developed a professional solution for inspecting not only wafer-based solar cells, but also for thin-film photovoltaic applications. At the beginning of this year, we were able to install the first system for inspecting incoming glass substrate material, taking advantage of our years of experience in glass inspection for the LCD and TFT industry.

The new optional feature allows you to connect up to four Basler inspection systems to a database, using a highly redundant SQL database server to guarantee secure server operation.