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In addition to the actual evaluation software for the inspection system, Basler offers an optional, so-called Office Viewer with a database. The inspection systems transfer the inspection results to the database. The Office Viewer is used to select inspection result data from the database and visualize it for analysis purposes.

The tool not only provides a detailed summary of the numerical inspection results, but also the relevant section of the defect image. The Export function enables you to create reports on wafer quality, including the defect images. In this way, you can process information on quality problems in a transparent manner and use it to optimize your production processes.

The screenshot shows the selection of microcracks within a certain period of time (left). Together with a schematic diagram of orientation and size of defect (top right), the system also depicts the defect image (lower centre) and the numerical result data (right). Users are promptly provided with a comprehensive overview of the quality of their production process.