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Basler's inspection system, which is designed for the detection of defects in solar wafers and has already made a name for itself on the photovoltaic market during the past year, is now available in a high-speed version. This means that you can even use the system inline in the fastest production processes in operation today.

A line-scan camera is used to inspect the wafer "on the fly", which means that is it not necessary to stop the wafer as it passes in order to conduct an optical inspection. Until now, the speed at which the wafer was allowed to cross the lens of the camera was restricted to a maximum of 200mm/s.
Increased demands from our customers have revealed that the throughput speed quoted is still not enough to meet certain individual requirements. In such cases, it is possible to enhance throughput up to a maximum speed of 450mm/s by integrating special camera technology. With no change in optical resolution, you can not only detect, but also reject, wafers with microcracks, inclusions, holes, or other types of defects.