NEW - Basler inspection solution now also available for thin-film photovoltaic applications
Basler has developed a professional solution for inspecting not only wafer-based solar cells, but also for thin-film photovoltaic applications. At the beginning of this year, we were able to install the first system for inspecting incoming glass substrate material, taking advantage of our years of experience in glass inspection for the LCD and TFT industry.
Glass inspection is not restricted to the inspection of incoming goods, but also arises in connection with a number of other checks conducted throughout the process of thin-film module production. Basler offers a comprehensive inspection concept for all known checks in current use.
Not only do homogeneous surfaces such as glass or coated glass require testing for local defects, but also coatings need to be inspected for colour deviation. In addition to this, the visual check has to be conducted with regard to structuring defects.
All these test functions are possible with Basler technologies.
We would be glad of the opportunity to present our concept of in-line inspection in thin-film production!
Defect groupings:
Glass defects
 | Size tolerances: substrate size |
 | Surface defects: cracks, edge-defects, scratches |
 | Bubbles and inclusions: inclusions and contamination/dirt |
Coating defects
 | Surface defects: de-lamination, visible holes, scratches, transmitting holes |
 | Structuring defects: continuity and quality of structuring lines |
 | Colour deviations: homogeneity of colour, no staining caused by arcing or interference |